Semiconductor device having display device

ABSTRACT

A semiconductor integrated circuit having a high withstand voltage TFT and a TFT which is capable of operating at high speed in a circuit of thin film transistors (TFT) and methods for fabricating such circuit will be provided. A gate insulating film of the TFT required to operate at high speed (e.g., TFT used for a logic circuit) is relatively thinned less than a gate insulating film of the TFT which is required to have high withstand voltage (e.g., TFT used for switching high voltage signals).

CROSS-REFERENCE TO RELATED APPLICATION

This application is a continuation application of U.S. application Ser. No. 10/872,375, filed on Jun. 22, 2004, which is a continuation application of U.S. application Ser. No. 10/657,137, filed on Sep. 9, 2003, which is a divisional application of U.S. application Ser. No. 09/967,697, filed on Sep. 28, 2001, now U.S. Pat. No. 6,657,228, which is a continuation of U.S. application Ser. No. 08/862,895, filed on May 23, 1997, now U.S. Pat. No. 6,316,787, which claims the benefit of a foreign priority application filed in Japan as Serial No. 8-165272, on Jun. 4, 1996, all of which are incorporated by reference.

BACKGROUND OF THE INVENTION

The present invention relates to a semiconductor integrated circuit having a plurality of thin film transistors (TFT) and more particularly to a monolithic active matrix circuit having an active matrix circuit and a logic circuit (called also as a peripheral circuit) for driving it on one and the same substrate and to a fabrication method thereof. The semiconductor integrated circuit fabricated by the present invention may be formed either on an insulating substrate such as glass and on an insulating coating film formed on a semiconductor substrate such as monocrystal silicon for example. The present invention exhibits its effect specifically in a semiconductor integrated circuit having a large matrix which operates at low speed and a logic circuit for driving it which is required to operate at high speed, such as a liquid crystal display.

DESCRIPTION OF RELATED ART

Recently, researches on an insulated gate type semiconductor device having a thin film semiconductor layer (also called as an active layer) on an insulating substrate are being conducted and specifically, researches on a thin film insulated gate transistor, i.e. a so-called thin film transistor (TFT), are being actively conducted. They are categorized as an amorphous silicon TFT or a crystal silicon TFT depending on a material and a crystal state of the semiconductor to be used.

Generally, a semiconductor in the amorphous state has a small field mobility, so it cannot be utilized for a TFT which is required to operate at high speed. Then, research and development on the crystal silicon TFT are being conducted in order to fabricate a higher performance circuit in these days.

In those TFTs, a thin film semiconductor region of each individual thin film transistor is isolated and hence, the channel portion has not been grounded like the conventional semiconductor integrated circuit on a semiconductor chip. Due to that, deterioration or failure peculiar to the TFT have occurred sometimes. For instance, with regard to a hot carrier implantation phenomenon, it has been extremely difficult to remove accumulated charge because the channel has been put in the state of floating potential.

Then, a gate insulating film has been thickened or applied voltage has been reduced in order to prevent the deterioration and the like caused by the implantation of carrier. However, operating speed decreases if the gate insulating film is thickened. It has been also difficult to reduce the applied voltage because of the requirement of a device. Because driving voltage of a matrix circuit is determined depending on a liquid crystal material in the monolithic active matrix circuit used for a liquid crystal display in particular, it is difficult to change it arbitrarily.

However, the operating speed of the logic circuit decreases if the gate insulating film is thickened. Then, driving voltage has to be increased to maintain the operating speed, increasing power consumption.

FIG. 11A is a block diagram showing the monolithic active matrix circuit used for a liquid crystal display. In the figure, a column driver 1 and a row driver 2 are provided on a substrate 7 as peripheral driver circuits, pixel circuits (pixels) 4 each comprising a transistor and a capacitor are formed in a matrix area 3 and the matrix area is connected with the peripheral circuits through wires 5 and 6.

Among the TFTs used for the driver circuits, high operating speed is required to the TFT composing the logic circuit such as a shift register and high withstand voltage is required to the TFT used in the pixel circuit. Even in the driver circuits, a part of transistors in a switching circuit (e.g. buffer circuit) is required to have high withstand voltage, rather than high operating speed.

Because the high operating speed and the high withstand voltage are contradictory requirements as described above, it has been difficult to form those transistors on one and the same substrate in one and the same process especially when it is required to reduce the power consumption. Accordingly, it is an object of the present invention to solve such difficult problems.

SUMMARY OF THE INVENTION

The present invention is characterized in that a thickness of a gate insulating film in a circuit in which priority is given to high operating speed is changed from that of a gate insulating film in a circuit in which priority is given to high withstand voltage. That is, the former is made to be a circuit which is driven in low voltage and operates at high speed and the latter is made to be a circuit having high withstand voltage by reducing the thickness of the gate insulating film of the former as compared to that of the latter.

In this case, among peripheral circuits, the circuits in which priority is given to high operating speed include logic circuits such as a shift register, a CPU, a memory circuit and a decoder circuit. Further, among peripheral circuits, the circuits in which priority is given to high withstand voltage include a high withstand voltage switching circuit, a buffer circuit and others.

A matrix circuit is also the circuit in which priority is given to high withstand voltage, though it is not the peripheral circuit.

Their difference is distinguished by a variation of voltage applied to the gate electrode in general. That is, the width of variation of voltage applied to the gate electrode is small in the former rather than in the latter.

Then, a semiconductor integrated circuit of a first invention is characterized in that a thickness of at least one gate insulating film of the thin film transistor of the circuit in which priority is given to high operating speed is 80% or less of a thickness of a gate insulating film of the thin film transistor of the circuit in which priority is given to high withstand voltage.

A semiconductor integrated circuit of a second invention is characterized in that at least one layer of another insulating layer is used for at least one gate insulating film of the thin film transistor of the circuit in which priority is given to high withstand voltage in addition to an insulating layer composing at least one gate insulating film of the thin film transistor of the circuit in which priority is given to high operating speed.

A semiconductor integrated circuit of a third invention is characterized in that when at least one gate insulating film of the thin film transistor of the circuit in which priority is given to high operating speed is assumed to be a first insulating layer, at least one gate insulating film of the thin film transistor of the circuit in which priority is given to high withstand voltage is composed of, in addition to the first insulating layer, a second insulating layer formed in a different process from the first insulating layer.

A semiconductor integrated circuit of a fourth invention is characterized in that in the semiconductor integrated circuit having a first thin film transistor and a second thin film transistor each having a gate insulating film whose thickness is different, the thickness of the gate insulating film of the first thin film transistor is 80% or less of the thickness of the gate insulating film of the second thin film transistor and a length of a channel of the first thin film transistor is 80% or less of a length of a channel of the second thin film transistor.

The semiconductor integrated circuit of the fourth invention is also characterized in that the thin film transistor used in the peripheral circuit which is required to operate at high speed is micronized in accordance to scaling law.

Specifically, the present invention is characterized in that the length of the channel in the circuit in which priority is given to high operating speed is changed from that of the channel in the circuit in which priority is given to high withstand voltage. That is, the length of the channel of the former is shortened as compared to that of the latter, or the length of the channel of the latter is prolonged as compared to that of the former, so as to make the former a transistor which is driven in low voltage and which operates at high speed and the latter a transistor of high withstand voltage.

Here, the scaling law to reduce physical dimensions of the TFT or wiring composing it, an interlayer film and others in inversely proportional to a certain coefficient. It allows enhancement of performance to be achieved in the same time with highly densified separation of devices.

According to the present invention, electrical characteristics of the peripheral circuit which is required to operate at high speed is improved by micronizing the channel length and the thickness of the gate insulating film in particular.

The micronization of the channel length may be achieved by modifying a shape of a mask in forming the gate electrode.

In the first through fourth invention described above, it is possible to include a low concentration impurity region that is formed by utilizing a difference of the thickness of the gate insulating films in the thin film transistor of the circuit in which priority is given to high withstand voltage. It allows high withstand voltage characteristics to be enhanced further.

Further, in the third invention described above, the chemical composition of the first insulating layer may be differentiated from that of the second insulating layer. Thereby, it becomes advantageous in fabricating them.

Similarly to that, in the third invention described above, only either one of the first insulating layer or the second insulating layer may be formed by means of thermal oxidation. It is of course possible to form the both by means of the thermal oxidation.

As for a method for fabricating the inventive semiconductor integrated circuit, there are the following inventions. The fifth invention comprises steps of:

1) forming a thin film semiconductor region utilized for a thin film transistor of a circuit in which priority is given to high withstand voltage and a thin film semiconductor region utilized for a thin film transistor of a circuit in which priority is given to high operating speed;

2) forming a first insulating layer covering both of the thin film semiconductor regions;

3) selectively removing the first insulating layer to remove all the first insulating layer covering the thin film semiconductor region composing at least one of the thin film transistor of the circuit in which priority is given to high operating speed by; and

4) forming a second insulating layer covering both of the thin film semiconductor regions.

The sixth invention comprises steps of:

1) forming a thin film semiconductor region utilized for a thin film transistor of a circuit in which priority is given to high withstand voltage and a thin film semiconductor region utilized for a thin film transistor of a circuit in which priority is given to high operating speed;

2) forming a first insulating layer covering both of the thin film semiconductor regions;

3) forming a second insulating layer covering the first insulating layer; and

4) selectively removing the second insulating layer to remove all the first insulating layer covering the thin film semiconductor region composing at least one of the thin film transistor of the circuit in which priority is given to high operating speed.

The seventh invention comprises steps of:

1) forming a thin film semiconductor region utilized for a thin film transistor of a circuit in which priority is given to high withstand voltage and a thin film semiconductor region utilized for a thin film transistor of a circuit in which priority is given to high operating speed;

2) selectively forming a first insulating layer covering both of the thin film semiconductor region except part of the thin film semiconductor region composing at least one of the thin film transistors of at least the circuit in which priority is given to high operating speed; and

3) forming a second insulating layer covering both of the thin film semiconductor regions.

In the fifth through seventh inventions described above, the first insulating layer may be formed by means of thermal oxidation. The second insulating layer may be also formed by means of thermal oxidation as a matter of course.

The fifth through seventh inventions described above may further comprise a step of forming gate electrodes whose width is different owing to shapes of mask of the gate electrodes so that the width of the gate electrode of the second thin film transistor is larger than the width of the gate electrode of the first thin film transistor.

It also comprises a step of forming a channel region having almost the same width with the width of the gate electrode under the gate electrode in a step of doping to the active layer.

While the length of the channel of the first thin film transistor has been set to be 80% or less of the length of the channel of the second thin film transistor, it has been found that the electrical characteristics such as operating speed improves when the ratio of the length of the channel of the first thin film transistor to that of the second thin film transistor is set preferably at 0.1 to 0.5.

Therefore, the ratio of the width of the gate electrode of the first thin film transistor to the width of the gate electrode of the second thin film transistor has been set within a range of 0.1 to 0.5.

The electrical characteristics such as operating speed improves further when the thickness of the gate insulating film of the first thin film transistor and the second thin film transistor is adjusted in accordance to this ratio.

Thereby, the thickness of the gate insulating film or the channel length may be changed in the circuit which is required to operate at high speed (e.g. a logic circuit in a monolithic active matrix circuit) and the circuit which is required to have high withstand voltage (a matrix circuit in the monolithic active matrix circuit). As a result, as for the monolithic active matrix circuit, the logic circuit which is driven in low voltage and operates at high speed and the high withstand voltage matrix circuit may be obtained on one and the same substrate, which is the purpose of the present invention. It is noted that as disclosed in, for example, Japanese Patent Laid Open No. Hei. 7-135323, the disclosure of which is herein incorporated by reference, the present invention is applicable to a semiconductor integrated circuit in which various memories and arithmetic devices are provided as logic circuits on one and the same substrate (see FIG. 11B). In FIG. 11B, a correction memory 8, a memory 9, an input port 10, a CPU 11, and an XY branch 12 are formed on a substrate 7 as well as a column decoder/driver 1, a row decoder/driver 2, and an active matrix 3. The present invention will be explained below in detail with reference to preferred embodiments.

BRIEF DESCRIPTION OF DRAWINGS

FIGS. 1A through 1F are section views showing a fabrication process according to a first embodiment:

FIGS. 2A through 2F are section views showing a fabrication process according to a second embodiment:

FIGS. 3A through 3F are section views showing a fabrication process according to a third embodiment:

FIGS. 4A through 4F are section views showing a fabrication process according to a fourth embodiment:

FIGS. 5A through 5F are section views showing a fabrication process according to a fifth embodiment:

FIGS. 6A through 6F are section views showing a fabrication process according to a sixth embodiment:

FIGS. 7A through 7C are section views showing a fabrication process according to an eighth embodiment:

FIGS. 8A through 8C are section views showing a fabrication process according to a ninth embodiment:

FIGS. 9A through 9C are section views of the fabrication process of the fifth embodiment using a resist film to selectively obtain a thermal oxide film;

FIGS. 10A through 10C are section views of the fabrication process of the sixth embodiment using a resist film to selectively obtain a thermal oxide film;

FIGS. 11A and 11B show structural examples of a monolithic active matrix circuit; and

FIGS. 12A through 12D show examples of equipment using a flat panel display according to a tenth embodiment.

DESCRIPTION OF PREFERRED EMBODIMENTS First Embodiment

FIGS. 1A through 1F are section views showing a fabrication process according to the present embodiment. In FIGS. 11A through 1F, a logic circuit 101 is formed on the left side of the paper and a matrix circuit 102 on the right side. At first, a base film (not shown) of silicon oxide of 2000 Å in thickness is formed on a substrate (Corning 7059) 11 by means of sputtering. Further, an intrinsic (I-type) amorphous silicon film of 500 to 1500 Å in thickness, or 500 Å for example, is deposited by means of plasma CVD. Then, it is crystallized by means of known thermal annealing. It may be crystallized by a method of irradiating light energy beam such as laser light or a lamp, instead of the thermal annealing, or by using combinations of the methods. The method of irradiating with a lamp is called a rapid thermal annealing (RTA) method.

The silicon film thus obtained is patterned by means of photolithography to separate into islands to form island regions 12 a and 12 b for TFTs of a logic circuit and an island region 12 c for a TFT of a matrix circuit.

Further, a silicon oxide film 13 of 1000 Å in thickness is deposited as a first gate insulating layer by means of sputtering. In the sputtering, silicon oxide is used as a target, a substrate temperature during the sputtering is 200 to 400° C., or 350° C. for example, and sputtering atmosphere composed of oxygen and argon is set to have a ratio of argon/oxygen=0 to 0.5, or 0.1 or less for example (FIG. 1A).

Further, a silicon nitride film of 1500 to 3000 Å in thickness is deposited by means of plasma CVD. It is then etched except a portion near a channel of the TFT of the matrix circuit to obtain a second gate insulating layer 14 (FIG. 1B).

Following to that, a silicon film (containing 0.1 to 2% of phosphorus) of 3000 to 8000 Å in thickness, or 6000 Å for example, is deposited by means of low pressure CVD. Then, it is etched to form gate electrodes 15 a, 15 b and 15 c (FIG. 1C).

The first gate insulating layer and the second gate insulating layer are then etched by using the respective gate electrodes as a mask to expose the surface of the island-like semiconductor regions. As a result, gate insulating films comprising the first gate insulating layers 13 a and 13 b (both used for the logic circuit) and a gate insulating film comprising the first gate insulating layer 13 c and the second gate insulating layer 14 c (used for the matrix circuit) are obtained (FIG. 1D).

Next, impurities (phosphorus and boron) are implanted to the silicon region by using the gate electrodes as a mask by means of known ion doping. Phosphine (PH₃) and diborane (B₂H₆) are used as the doping gas and the dosage thereof is 1×10¹⁵ to 8×10¹⁵ cm⁻², e.g. 2×10¹⁵ cm⁻² of phosphorus and 5×10¹⁵ cm⁻² of boron. As a result, a P-type impurity region 16 a and N-type impurity regions 16 b and 16 c are formed.

After that, the impurities are activated by means of laser annealing. Although a KrF excimer laser (wavelength: 248 nm, pulse width: 20 nsec) is used as the laser, other lasers such as a XeF excimer laser (wavelength: 353 nm), a XeCl excimer laser (wavelength: 308 nm), an ArF excimer laser (wavelength: 193 nm) and the like may be used. Energy density of the laser is 200 to 400 mJ/cm², or 250 mJ/cm² for example, and the laser is irradiated by 2 to 10 shots, or 2 shots for example, per one spot. The substrate is heated up to 100 to 450° C., or 250° C. for example, in irradiating the laser. Further, this activation can be also performed by the RTA method.

Thus the impurity regions 16 a through 16 c are activated. This step may be carried out also by means of thermal annealing (FIG. 1E). Further, this activation can be also performed by the RTA method.

Following to that, a silicon oxide film 17 of 6000 Å in thickness is formed as an interlayer insulator by means of plasma CVD. Contact holes are formed therethrough and electrode/wires 18 a and 18 b for the logic circuit and an electrode/wire 18 c for the matrix circuit are formed by using metallic materials such as a multi-layered film of titanium nitride and aluminum.

Further, an indium tin oxide film (ITO) of 500 to 1000 Å in thickness, or 800 Å for example, is formed by means of sputtering and is patterned to form a pixel electrode 19.

Finally, annealing is implemented at 350° C. for 30 minutes within one atmospheric pressure of hydrogen atmosphere. Through the above-mentioned steps, a semiconductor integrated circuit having a P-channel type TFT 20 a and an N-channel type TFT 20 b of the logic circuit and a TFT 20 c of the matrix circuit is completed. It is noted that a buffer transistor of a driver circuit may be fabricated in the same manner with the transistor of the matrix circuit described in the above-mentioned embodiment (FIG. 1F).

Second Embodiment

FIGS. 2A through 2F are section views showing a fabrication process according to the present embodiment. In FIGS. 2A through 2F, a logic circuit 201 is formed on the left side of the paper and a matrix circuit 202 on the right side. At first, a base film (not shown) of silicon oxide of 2000 Å in thickness is formed on a substrate (Corning 7059) 21. Further, an intrinsic (I-type) crystalline silicon film of 500 to 1500 Å in thickness, or 500 Å for example, is deposited by means of plasma CVD. The silicon film is then separated into islands to form island regions 22 a and 22 b for TFTs of a logic circuit and an island region 22 c for a TFT of a matrix circuit.

Further, a silicon oxide film 23 of 1000 Å in thickness is deposited as a first gate insulating layer by means of plasma CVD (FIG. 2A).

Further, a silicon nitride film of 1000 Å in thickness is deposited by means of plasma CVD. Then, the silicon nitride film is etched except a portion near a channel of the TFT of the matrix circuit. Here, the portion having a width of 5 μm from an edge of a gate electrode to be formed later is left. Thus, a second gate insulating layer 24 is obtained (FIG. 2B).

Following to that, a silicon film (containing 0.1 to 2% of phosphorus) of 3000 to 8000 Å in thickness, or 6000 Å for example, is deposited by means of low pressure CVD. It is then etched to form gate electrodes 25 a, 25 b and 25 c (FIG. 2C).

Next, impurities (phosphorus and boron) are implanted to the silicon region by using the gate electrodes as a mask by means of known ion doping. Phosphine (PH₃) and diborane (B₂H₆) are used as the doping gas. Because through doping, i.e. doping carried out transmitting through a gate insulating film, is implemented in the present embodiment, acceleration voltage is increased more than that of the first embodiment.

Further, while the doping is implemented at higher acceleration voltage at the portion below the gate insulating layer 24 because the gate insulating film is thick there as compared to other parts, the dosage is lowered by 1 to 2 digits.

As a result, an N-type low concentration impurity region 26 d is formed in addition to a P-type high concentration impurity region 26 a and N-type high concentration impurity regions 26 b and 26 c. The technology for changing the concentration of impurity by utilizing a difference of thickness of gate insulating films has been disclosed in such as Japanese Patent Laid Open Nos. Hei. 7-169974, Hei. 7-169975, Hei. 7-218932, the disclosures of which are herein incorporated by reference (FIG. 2D).

After activating the impurities, a silicon nitride film 27 of 4000 Å in thickness is formed as a first interlayer insulator by means of plasma CVD. Contact holes are formed therethrough and electrode/wires 28 a and 28 b for the logic circuit and an electrode/wire 28 c for the matrix circuit are formed by using aluminum (FIG. 2E).

Further, an organic resin film 29 is formed as a second interlayer insulator. Then, after forming contact holes thereon, an indium tin oxide film (ITO) of 800 Å in thickness is formed by means of sputtering and is patterned to form a pixel electrode 30.

Through the above-mentioned steps, a semiconductor integrated circuit having a P-channel type TFT 31 a and an N-channel type TFT 31 b of the logic circuit and a TFT 31 c of the matrix circuit is completed (FIG. 2F).

Third Embodiment

FIGS. 3A through 3F are section views showing a fabrication process according to the present embodiment. In FIGS. 3A through 3F, a logic circuit 301 is formed on the left side of the paper and a matrix circuit 302 on the right side. At first, an intrinsic (I-type) crystalline silicon film of 800 Å in thickness is formed on a substrate (quartz) 32. The silicon film is then separated into islands to form island regions 33 a and 33 b for TFTs of a logic circuit and an island region 33 c for a TFT of a matrix circuit.

Further, a silicon oxide film 34 of 1000 Å in thickness is deposited on the whole surface by means of plasma CVD (FIG. 3A).

Next, the silicon oxide film 34 at the part of the logic circuit is etched to form a first gate insulating layer 34 a in the matrix circuit region (FIG. 3B).

Following to that, a gate insulating film of silicon oxide is formed on the surface of the silicon region by implementing thermal oxidation in 850 to 1150° C., or at 950° C. for example. At this time, the silicon oxide is formed so as to be 500 Å in thickness in the logic circuit region thermally oxidized in the state in which the silicon layer has been exposed. Because the surface of the matrix circuit is covered by the silicon oxide film formed by means of the plasma CVD, the progress of the thermal oxidation is more moderate and a thickness of the whole silicon oxide is 1500 Å or less. Thus, gate insulating films 35 a, 35 b and 35 c are obtained (FIG. 3C).

Following to that, an aluminum film of 4000 to 6000 Å, or 5000 Å in thickness for example, is deposited by means of sputtering. It is then etched to form gate electrodes 36 a, 36 b and 36 c. Further, the gate insulating films 35 a through 35 c are etched by using the gate electrodes as a mask (FIG. 3D).

Next, impurities (phosphorus and boron) are implanted to the silicon region by using the gate electrodes as a mask by means of known ion doping to form a P-type impurity region 37 a and N-type impurity regions 37 b and 37 c (FIG. 3E).

After activating the impurities, a silicon oxide film 38 of 4000 Å in thickness is formed as an interlayer insulator. Contact holes are formed therethrough and electrode/wires 39 a and 39 b for the logic circuit and an electrode/wire 39 c for the matrix circuit are formed by aluminum.

Through the above-mentioned steps, a semiconductor integrated circuit having a P-channel type TFT 40 a and an N-channel type TFT 40 b of the logic circuit and a TFT 40 c of the matrix circuit is completed (FIG. 3F).

The pixel electrode may be added in the manner as described in the second embodiment.

Fourth Embodiment

FIGS. 4A through 4F are section views showing a fabrication process according to the present embodiment. In FIGS. 4A through 4F, a logic circuit 401 is formed on the left side of the paper and a matrix circuit 402 on the right side. At first, an intrinsic (I-type) crystal silicon film of 600 Å in thickness is formed on a substrate (quartz) 41. The silicon film is then separated into islands to form island regions 42 a and 42 b for TFTs of a logic circuit and an island region 42 c for a TFT of a matrix circuit.

Further, a silicon oxide film 43 of 1000 Å in thickness is deposited on the whole surface by means of plasma CVD (FIG. 4A).

Next, the silicon oxide film 43 is etched except a portion near a channel of the TFT of the matrix circuit. Here, the portion having a width of 3 μm from the edge of a gate electrode to be formed later is left. Thus, a first gate insulating layer 43 a is formed in the matrix circuit region (FIG. 4B).

Following to that, a gate insulating film of silicon oxide is formed on the surface of the silicon region by implementing thermal oxidation at 950° C. At this time, the silicon oxide is formed to be 400 Å in thickness in the logic circuit region thermally oxidized in the state in which the silicon layer has been exposed. Thus, gate insulating films 44 a, 44 b and 44 c are obtained (FIG. 4C).

Following to that, an aluminum film of 4000 Å in thickness is deposited by means of sputtering. It is then etched to form gate electrodes 45 a, 45 b and 45 c (FIG. 4D).

Next, impurities (phosphorus and boron) are implanted to the silicon region by using the gate electrodes as a mask by means of known ion doping. At this time, two-stage doping is implemented by changing acceleration voltage similarly to the second embodiment to form an N-type low concentration impurity region 46 d in addition to a P-type high concentration impurity region 46 a and N-type high concentration impurity regions 46 b and 46 c (FIG. 4E).

After activating the impurities, a silicon oxide film 47 of 6000 Å in thickness is formed as an interlayer insulator. Contact holes are formed therethrough and electrode/wires 48 a and 48 b for the logic circuit and an electrode/wire 48 c for the matrix circuit are formed by aluminum.

Through the above-mentioned steps, a semiconductor integrated circuit having a P-channel type TFT 49 a and an N-channel type TFT 49 b of the logic circuit and a TFT 49 c of the matrix circuit is completed (FIG. 4F).

Fifth Embodiment

FIGS. 5A through 5F are section views showing a fabrication process according to the present embodiment. In FIGS. 5A through 5F, a logic circuit 501 is formed on the left side of the paper and a matrix circuit 502 on the right side. At first, an intrinsic (I-type) crystalline silicon film of 600 Å in thickness is formed on a substrate (quartz) 51. The silicon film is then separated into islands to form island regions 52 a and 52 b for TFTs of a logic circuit and an island region 52 c for a TFT of a matrix circuit.

Further, silicon oxide films 53 a, 53 b and 53 c of 500 Å in thickness are formed by means of thermal oxidation (FIG. 5A).

Next, the silicon oxide films 53 a and 53 b existing on the part of the logic circuit are etched (FIG. 5B).

The state shown in FIG. 5B obtained by the steps so far can be obtained also by forming a resist film 93 except the part of the logic circuit after separating the silicon film into the islands (FIG. 9A), by implementing the thermal oxidation (FIG. 9B) and then by removing the resist film (FIG. 9C).

Following to that, a gate insulating film of silicon oxide is formed on the surface of the silicon region by implementing another thermal oxidation at 950° C. At this time, the silicon oxide is formed to be 400 Å in thickness in the logic circuit region thermally oxidized in the state in which the silicon layer has been exposed. Thus, gate insulating films 54 a, 54 b and 54 c are obtained (FIG. 5C).

Following to that, an aluminum film of 4000 Å in thickness is deposited by means of sputtering. It is then etched to form gate electrodes 55 a, 55 b and 55 c. Further, the gate insulating films 54 a, 54 b and 54 c are etched by using the gate electrodes as a mask (FIG. 5D).

Next, impurities (phosphorus and boron) are implanted to the silicon region by using the gate electrodes as a mask by means of known ion doping. Then, a P-type impurity region 56 a and N-type impurity regions 56 b and 56 c are formed (FIG. 5E).

After activating the impurities, a silicon oxide film 57 of 6000 Å in thickness is formed as an interlayer insulator. Contact holes are formed therethrough and electrode/wires 58 a and 58 b for the logic circuit and an electrode/wire 58 c for the matrix circuit are formed by aluminum.

Through the above-mentioned steps, a semiconductor integrated circuit having a P-channel type TFT 59 a and an N-channel type TFT 59 b of the logic circuit and a TFT 59 c of the matrix circuit is completed (FIG. 5F).

Sixth Embodiment

FIGS. 6A through 6F are section views showing a fabrication process according to the present embodiment. In FIGS. 6A through 6F, a logic circuit 601 is formed on the left side of the paper and a matrix circuit 602 on the right side. At first, an intrinsic (I-type) crystalline silicon film of 600 Å in thickness is formed on a substrate (quartz) 61. The silicon film is then separated into islands to form island regions 62 a and 62 b for TFTs of a logic circuit and an island region 62 c for a TFT of a matrix circuit.

Further, silicon oxide films 63 a, 63 b and 63 c of 500 Å in thickness are formed by means of thermal oxidation (FIG. 6A).

Next, the silicon oxide films 63 a and 63 b existing on the part of the logic circuit are etched. The silicon oxide film 63 c at the matrix circuit is left (FIG. 6B).

Next, the silicon oxide films 63 a, 63 b and 63 c are etched except the silicon oxide film 63 d at the part near the channel of the TFT of the matrix circuit. The silicon oxide film 63 d is left up to the part having a width of 3 μm from the edge of a gate electrode to be formed later (FIG. 6B).

The state shown in FIG. 6B obtained by the steps so far can be obtained also by forming a resist film 103 except the part having the width of 3 μm from the edge of the gate electrode to be formed later after separating the silicon film into the islands (FIG. 10A), by implementing the thermal oxidation (FIG. 10B) and then by removing the resist film (FIG. 10C).

Following to that, a gate insulating film of silicon oxide is formed on the surface of the silicon region by implementing another thermal oxidation at 950° C. At this time, the silicon oxide is formed to be 400 Å in thickness in the part where the silicon layer is exposed. Thus, gate insulating films 64 a, 64 b and 64 c are obtained (FIG. 6C).

Next, an aluminum film of 4000 Å in thickness is deposited by means of sputtering. It is then etched to form gate electrodes 65 a, 65 b and 65 c (FIG. 6D).

Next, impurities (phosphorus and boron) are implanted to the silicon region by using the gate electrodes as a mask by means of known ion doping. At this time, the two-stage doping is carried out by changing acceleration voltage similarly to the second or fourth embodiment to form an N-type low concentration impurity region 66 d in addition to a P-type high concentration impurity region 66 a and N-type high concentration impurity regions 66 b and 66 c (FIG. 6E).

After activating the impurities, a silicon oxide film 67 of 6000 Å in thickness is formed as an interlayer insulator. Contact holes are formed therethrough and electrode/wires 68 a and 68 b for the logic circuit and an electrode/wire 68 c for the matrix circuit are formed by aluminum.

Through the above-mentioned steps, a semiconductor integrated circuit having a P-channel type TFT 69 a and an N-channel type TFT 69 b of the logic circuit and a TFT 69 c of the matrix circuit is completed (FIG. 6F).

Seventh Embodiment

While the case of thickening the gate insulating film of the matrix circuit has been shown in the third embodiment, a gate insulating film of circuits in which priority is given to high operating speed such as a shift register circuit, a CPU circuit, a decoder circuit, a memory circuit and others among peripheral circuits is thinned as compared to a gate insulating film of circuits in which priority is given to high withstand voltage such as a high withstand voltage switching circuit and a buffer circuit in the present embodiment.

The gate insulating film of the circuit in which priority is given to high operating speed among the peripheral circuits is thinned by using the same process with that in the third embodiment.

Eighth Embodiment

While the case of thinning the gate insulating film of the circuit in which priority is given to high operating speed has been shown in the seventh embodiment, a length of the channel is shortened further by reducing a width of a gate electrode of the circuit having the thin gate insulating film in the present embodiment.

The present embodiment shares the same process with the third embodiment up to the step of depositing the aluminum film of 4000 to 6000 Å, or 5000 Å in thickness for example, by means of sputtering after forming the silicon oxide film.

In the present embodiment, with respect to the peripheral circuits 700, a width of gate electrodes 76 a and 76 b of the circuit 701 in which priority is given to high operating speed, for example, a shift register circuit, is reduced to 1 μm which is narrower than a width of a gate electrode 76 c (width: 2 μm) of the circuit 702 in which priority is given to high withstand voltage, for example, a buffer circuit, in an etching step thereafter (FIG. 7A).

Here, although the ratio of the width of the gate electrode of the circuit in which priority is given to high operating speed to the width of the gate electrode of the circuit in which priority is given to high withstand voltage has been 0.5 in the present embodiment, it is not limited to the value of the present embodiment so long as it is within a range of 0.1 to 0.5.

Next, impurities (phosphorus and boron) are implanted to the silicon region by using the gate electrodes as a mask by means of known ion doping to form a P-type impurity region 77 a and N-type impurity regions 77 b and 77 c (FIG. 7B).

Through this step, the length of the channel of the circuit in which priority is given to high operating speed is reduced to 80% or less of the length of the channel of the circuit in which priority is given to high withstand voltage.

Further, a length of the channel formed in contact with the gate electrode formed in this step has almost the same length with the width of the gate electrode.

Accordingly, the ratio of the length of the channel of the circuit in which priority is given to high operating speed to that of the circuit in which priority is given to high withstand voltage becomes 0.5 similarly to the ratio of the width of the gate electrodes in the present embodiment. The ratio of the length of the channels is not also limited to the value of the present embodiment so long as it is within the range of 0.1 to 0.5, similarly to the width of the gate electrodes.

After activating the impurities, a silicon oxide film 78 of 4000 Å in thickness is formed as an interlayer insulator. Contact holes are formed therethrough and electrode/wires 79 a and 79 b for the circuit in which priority is given to high operating speed and an electrode/wire 79 c for the circuit in which priority is given to high withstand voltage are formed by aluminum.

Through the above-mentioned steps, a semiconductor integrated circuit having a P-channel type TFT 80 a and an N-channel type TFT 80 b of the circuit in which priority is given to high operating speed and a TFT 80 c of the circuit in which priority is given to high withstand voltage is completed (FIG. 7C).

The pixel electrode may be added in the manner as described in the second embodiment.

Ninth Embodiment

While the case of laminating the first and second gate insulating films in the matrix circuit has been shown in the first embodiment, a length of the channel is shortened by reducing the width of the gate electrode of the circuit in which only the first gate insulating film is used in the present embodiment.

The present embodiment shares the same process with the first embodiment up to the step of depositing the silicon film (containing 0.1 to 2% of phosphorus) of 3000 to 8000 Å, or 6000 Å in thickness for example, on the gate insulating film by means of the low pressure CVD.

In the present embodiment, with respect to the peripheral circuits 800, a width of gate electrodes 86 a and 86 b of the circuit 801 in which priority is given to high operating speed, for example, a shift register circuit, is reduced to 1 μm which is narrower than a width of a gate electrode 86 c (width: 2 μm) of the circuit 802 in which priority is given to high withstand voltage, for example, a buffer circuit, in an etching step thereafter (FIG. 8A).

Here, although the ratio of the width of the gate electrode of the circuit in which priority is given to high operating speed to the width of the gate electrode of the circuit in which priority is given to high withstand voltage has been 0.5 in the present embodiment, it is not limited to the value of the present embodiment so long as it is within a range of 0.1 to 0.5.

The first gate insulating layer and the second gate insulating layer are etched by using respective gate electrodes as a mask to expose the surface of the island semiconductor regions (FIG. 8A).

Next, impurities (phosphorus and boron) are implanted to the silicon region by using the gate electrodes as a mask by means of known ion doping. Phosphine (PH₃) and diborane (B₂H₆) are used as the doping gas and the dosage thereof is 1×10¹⁵ to 8×10¹⁵ cm⁻², e.g. 2×10¹⁵ cm⁻² of phosphorus and 5×10¹⁵ cm⁻² of boron. As a result, a P-type impurity region 87 a and N-type impurity regions 87 b and 87 c are formed (FIG. 8B).

After activating the impurities, a silicon oxide film 88 of 4000 Å in thickness is formed as an interlayer insulator. Contact holes are formed therethrough and electrode/wires 89 a and 89 b for the circuit in which priority is given to high operating speed and an electrode/wire 89 c for the circuit in which priority is given to high withstand voltage are formed by aluminum.

Through the above-mentioned steps, the semiconductor integrated circuit having a P-channel type TFT 90 a and an N-channel type TFT 90 b of the circuit in which priority is given to high operating speed and a TFT 90 c of the circuit in which priority is given to high withstand voltage is completed (FIG. 8C).

Further, a length of the channel formed in contact with the gate electrode formed in this step has substantially the same width with that of the gate electrode. Accordingly, the ratio of the length of the channel of the circuit in which priority is given to high operating speed to that of the circuit in which priority is given to high withstand voltage is not also limited to the value of the present embodiment so long as it is within the range of 0.1 to 0.5, similarly to the width of the gate electrode of the present invention.

The pixel electrode may be added in the manner as described in the second embodiment.

Tenth Embodiment

A liquid crystal display fabricated by utilizing the present specification is called as a flat panel type display device. As such display device, there have been known ones using EL (electroluminescence) materials and using EC (electrochromic) materials, beside one utilizing the optical characteristics of liquid crystal. The invention disclosed in the present specification may be utilized in an active matrix type flat panel display which uses those materials and in which peripheral driving circuits and the like are integrated. The liquid crystal display (LCD) device manufactured using the present invention can be applied to either a transmission type or a reflection type.

Such display may be utilized in the following uses. FIG. 12A shows an equipment called a digital still camera, an electronic camera or a video movie which can display motion pictures.

This equipment has functions of electronically keeping images taken by a CCD camera (or other adequate photographic means) disposed at a camera section 2002 and of displaying the images on a display device 2003 disposed within a main body 2001. The equipment may be manipulated by control buttons 2004.

The invention disclosed in the present specification may be utilized in the display device constructed as described above. Because power consumption may be saved by utilizing the invention disclosed in the present specification, it is useful for the portable equipment as shown in FIG. 12A which is supposed to be driven by a battery.

FIG. 12B shows a portable personal computer. This equipment is provided with a display device 2104 on an openable cover 2102 attached to a main body 2101 and allows to input various information from a key board 2103 and to run various operations.

It is also useful to utilize the invention disclosed in the present specification for the display device 2104 arranged as shown in FIG. 12B.

FIG. 12C shows a case when the flat panel display is utilized in a car navigation system. The car navigation system comprises an antenna section 2304 and a main body provided with a display 2302.

Switching of various information required in navigation is can be made by control buttons 2303. It is generally controlled by a remote control unit not shown.

FIG. 12D shows a case of a projection type liquid crystal display. In the figure, light emitted from a light source 2402 is optically modulated by a liquid crystal display device 2403 and is turned into an image. The image is reflected by mirrors 2404 and 2405 to be projected on a screen 2406.

As shown in the above-mentioned embodiments, the present invention allows the TFT which can operate at high speed in low voltage and the TFT which is characterized by the high withstand voltage to be formed on one and the same substrate. Applying this to the liquid crystal display allows the reliability, the power consumption and the characteristics to be improved as a whole.

It is noted that the features and advantages of the present invention may be clearly understood if one notices on that the conventional semiconductor integrated circuit technology has not required to change the thickness of the gate insulating film actively like the present invention. In the conventional semiconductor integrated circuit (in digital circuits in particular), voltage to be used has been all the same within the circuit. For instance, the memory area and the peripheral circuit have been driven by single voltage in a DRAM.

However, a liquid crystal display requires a plurality of voltages because voltage suitable for the liquid crystal material differs from voltage suitable for driving transistors in the liquid crystal display. Generally, the former is higher than the latter.

If there is a plurality of voltages, dimensions of a transistors suited to that also have to be changed. The present invention has noticed on this point. Accordingly, the idea of the present invention would not be brought out from the technology of the conventional semiconductor integrated circuit driven by single voltage. Thus, the present invention is useful from the industrial point of view. 

1. A semiconductor device comprising at least a display device, said display device comprising: a substrate having an insulating surface; a semiconductor layer over the substrate, said semiconductor layer including at least a channel region; a first insulating film comprising silicon oxide formed over the semiconductor layer; a second insulating film comprising silicon nitride formed over the first insulating film; a gate electrode located over the channel region of the semiconductor layer with the first insulating film and the second insulating film interposed therebetween; a third insulating film comprising silicon nitride formed over the semiconductor layer, the first and second insulating films and the gate electrode, wherein said second insulating film extends beyond edges of the gate electrode; wherein said first insulating film extends beyond edges of the second insulating film, and wherein said third insulating film is in direct contact with an upper surface of an extending portion of the first insulating film and an upper surface of an extending portion of the second insulating film.
 2. A semiconductor device comprising at least a display device, said display device comprising: a substrate having an insulating surface; a semiconductor layer over the substrate, said semiconductor layer including at least a pair of impurity regions and a channel region; a first insulating film comprising silicon oxide formed over the semiconductor layer; a second insulating film comprising silicon nitride formed over the first insulating film; a gate electrode located over the channel region of the semiconductor layer with the first insulating film and the second insulating film interposed therebetween; a third insulating film comprising silicon nitride formed over the semiconductor layer, the first and second insulating films and the gate electrode, said third insulating film having at least one contact hole; at least one of source and drain electrodes formed over said third insulating film, wherein said second insulating film extends beyond edges of the gate electrode, wherein said first insulating film extends beyond edges of the second insulating film, and wherein said third insulating film is in direct contact with an upper surface of an extending portion of the first insulating film and an upper surface of an extending portion of the second insulating film, and wherein said one of the source and drain electrodes is electrically connected to one of said pair of impurity regions through the contact hole, and wherein said one of the source and drain electrodes is not in direct contact with the second insulating film.
 3. A semiconductor device comprising at least a display device, said display device comprising: a substrate having an insulating surface; a semiconductor layer over the substrate, said semiconductor layer including at least a channel region; a first insulating film comprising silicon oxide formed over the semiconductor layer; a second insulating film comprising silicon nitride formed over the first insulating film; a gate electrode located over the channel region of the semiconductor layer with the first insulating film and the second insulating film interposed therebetween; a third insulating film comprising silicon nitride formed over the semiconductor layer, the first and second insulating films and the gate electrode, wherein said second insulating film extends beyond edges of the gate electrode; wherein said first insulating film extends beyond edges of the second insulating film, and wherein said third insulating film is in direct contact with an upper surface of an extending portion of the first insulating film and an upper surface of an extending portion of the second insulating film, and wherein said third insulating film is in direct contact with an upper surface of the gate electrode and side surfaces of the gate electrode.
 4. A semiconductor device comprising at least a display device, said display device comprising: a substrate having an insulating surface; a semiconductor layer over the substrate, said semiconductor layer including at least a pair of impurity regions and at least one lightly doped impurity region between the channel region and one of the pair of impurity regions; a first insulating film comprising silicon oxide formed over the semiconductor layer; a second insulating film comprising silicon nitride formed over the first insulating film; a gate electrode located over the channel region of the semiconductor layer with the first insulating film and the second insulating film interposed therebetween; a third insulating film comprising silicon nitride formed over the semiconductor layer, the first and second insulating films and the gate electrode, wherein said second insulating film extends beyond edges of the gate electrode; wherein said first insulating film extends beyond edges of the second insulating film, and wherein said third insulating film is in direct contact with an upper surface of an extending portion of the first insulating film and an upper surface of an extending portion of the second insulating film, wherein said second insulating film overlaps said lightly doped impurity region.
 5. A semiconductor device comprising at least a display device, said display device comprising: a substrate having an insulating surface; a semiconductor layer over the substrate, said semiconductor layer including at least a pair of impurity regions and a channel region; a first insulating film comprising silicon oxide formed over the semiconductor layer; a second insulating film comprising silicon nitride formed over the first insulating film; a gate electrode located over the channel region of the semiconductor layer with the first insulating film and the second insulating film interposed therebetween; a third insulating film comprising silicon nitride formed over the semiconductor layer, the first and second insulating films and the gate electrode, said third insulating film having at least one contact hole; at least one of source and drain electrodes formed over said third insulating film, wherein said second insulating film extends beyond edges of the gate electrode, wherein said first insulating film extends beyond edges of the second insulating film, and wherein said third insulating film is in direct contact with an upper surface of an extending portion of the first insulating film and an upper surface of an extending portion of the second insulating film, and wherein said one of the source and drain electrodes is electrically connected to one of said pair of impurity regions through the contact hole, and wherein said one of the source and drain electrodes is not in direct contact with the second insulating film, and wherein said third insulating film is in direct contact with an upper surface of the gate electrode and side surfaces of the gate electrode.
 6. A semiconductor device comprising at least a display device, said display device comprising: a substrate having an insulating surface; a semiconductor layer over the substrate, said semiconductor layer including at least a pair of impurity regions and a channel region; a first insulating film comprising silicon oxide formed over the semiconductor layer; a second insulating film comprising silicon nitride formed over the first insulating film; a gate electrode located over the channel region of the semiconductor layer with the first insulating film and the second insulating film interposed therebetween; a third insulating film comprising silicon nitride formed over the semiconductor layer, the first and second insulating films and the gate electrode; a fourth insulating film formed over said third insulating film comprises an organic resin; a pixel electrode formed over said fourth insulating film wherein said pixel electrode is electrically connected to one of said pair of impurity regions, wherein said second insulating film extends beyond edges of the gate electrode; wherein said first insulating film extends beyond edges of the second insulating film, and wherein said third insulating film is in direct contact with an upper surface of an extending portion of the first insulating film and an upper surface of an extending portion of the second insulating film.
 7. A semiconductor device comprising at least a display device, said display device comprising: a substrate having an insulating surface; a semiconductor layer over the substrate, said semiconductor layer including at least a pair of impurity regions and a channel region; a first insulating film comprising silicon oxide formed over the semiconductor layer; a second insulating film comprising silicon nitride formed over the first insulating film; a gate electrode located over the channel region of the semiconductor layer with the first insulating film and the second insulating film interposed therebetween; a third insulating film comprising silicon nitride formed over the semiconductor layer, the first and second insulating films and the gate electrode, said third insulating film having at least one contact hole, at least one of source and drain electrodes formed over said third insulating film; a fourth insulating film formed over said third insulating film comprises an organic resin; a pixel electrode formed over said fourth insulating film wherein said pixel electrode is electrically connected to one of said pair of impurity regions, wherein said second insulating film extends beyond edges of the gate electrode; wherein said first insulating film extends beyond edges of the second insulating film, and wherein said third insulating film is in direct contact with an upper surface of an extending portion of the first insulating film and an upper surface of an extending portion of the second insulating film, and wherein said one of the source and drain electrodes is electrically connected to one of said pair of impurity regions through the contact hole, and wherein said one of the source and drain electrodes is not in direct contact with the second insulating film.
 8. A semiconductor device comprising at least a display device, said display device comprising: a substrate having an insulating surface; a semiconductor layer over the substrate, said semiconductor layer including at least a pair of impurity regions and a channel region; a first insulating film comprising silicon oxide formed over the semiconductor layer; a second insulating film comprising silicon nitride formed over the first insulating film; a gate electrode located over the channel region of the semiconductor layer with the first insulating film and the second insulating film interposed therebetween; a third insulating film comprising silicon nitride formed over the semiconductor layer, the first and second insulating films and the gate electrode; a fourth insulating film formed over said third insulating film comprises an organic resin; a pixel electrode formed over said fourth insulating film wherein said pixel electrode is electrically connected to one of said pair of impurity regions, wherein said second insulating film extends beyond edges of the gate electrode; wherein said first insulating film extends beyond edges of the second insulating film, and wherein said third insulating film is in direct contact with an upper surface of an extending portion of the first insulating film and an upper surface of an extending portion of the second insulating film, and wherein said third insulating film is in direct contact with an upper surface of the gate electrode and side surfaces of the gate electrode.
 9. A semiconductor device comprising at least a display device, said display device comprising: a substrate having an insulating surface; a semiconductor layer over the substrate, said semiconductor layer including at least a pair of impurity regions and at least one lightly doped impurity region between the channel region and one of the pair of impurity regions; a first insulating film comprising silicon oxide formed over the semiconductor layer; a second insulating film comprising silicon nitride formed over the first insulating film; a gate electrode located over the channel region of the semiconductor layer with the first insulating film and the second insulating film interposed therebetween; a third insulating film comprising silicon nitride formed over the semiconductor layer, the first and second insulating films and the gate electrode; a fourth insulating film formed over said third insulating film comprises an organic resin; a pixel electrode formed over said fourth insulating film wherein said pixel electrode is electrically connected to one of said pair of impurity regions, wherein said second insulating film extends beyond edges of the gate electrode, wherein said first insulating film extends beyond edges of the second insulating film, and wherein said third insulating film is in direct contact with an upper surface of an extending portion of the first insulating film and an upper surface of an extending portion of the second insulating film, wherein said second insulating film overlaps said lightly doped impurity region.
 10. A semiconductor device comprising at least a display device, said display device comprising: a substrate having an insulating surface; a semiconductor layer over the substrate, said semiconductor layer including at least a pair of impurity regions and a channel region; a first insulating film comprising silicon oxide formed over the semiconductor layer; a second insulating film comprising silicon nitride formed over the first insulating film; a gate electrode located over the channel region of the semiconductor layer with the first insulating film and the second insulating film interposed therebetween; a third insulating film comprising silicon nitride formed over the semiconductor layer, the first and second insulating films and the gate electrode, said third insulating film having at least one contact hole; at least one of source and drain electrodes formed over said third insulating film; a fourth insulating film formed over said third insulating film comprises an organic resin; a pixel electrode formed over said fourth insulating film wherein said pixel electrode is electrically connected to one of said pair of impurity regions, wherein said second insulating film extends beyond edges of the gate electrode, wherein said first insulating film extends beyond edges of the second insulating film, and wherein said third insulating film is in direct contact with an upper surface of an extending portion of the first insulating film and an upper surface of an extending portion of the second insulating film, and wherein said one of the source and drain electrodes is electrically connected to one of said pair of impurity regions through the contact hole, and wherein said one of the source and drain electrodes is not in direct contact with the second insulating film, and wherein said third insulating film is in direct contact with an upper surface of the gate electrode and side surfaces of the gate electrode.
 11. A semiconductor device according to any one of claim 1, further comprising a fourth insulating film formed over said third insulating film, wherein said fourth insulating film comprises an organic resin.
 12. A semiconductor device according to any one of claim 2, further comprising a fourth insulating film formed over said third insulating film, wherein said fourth insulating film comprises an organic resin.
 13. A semiconductor device according to any one of claim 3, further comprising a fourth insulating film formed over said third insulating film, wherein said fourth insulating film comprises an organic resin.
 14. A semiconductor device according to any one of claim 4, further comprising a fourth insulating film formed over said third insulating film, wherein said fourth insulating film comprises an organic resin.
 15. A semiconductor device according to any one of claim 5, further comprising a fourth insulating film formed over said third insulating film, wherein said fourth insulating film comprises an organic resin.
 16. A semiconductor device according to claim 1, wherein said semiconductor layer includes a pair of impurity regions, wherein said semiconductor layer includes at least one lightly doped impurity region between the channel region and one of the pair of impurity regions.
 17. A semiconductor device according to any one of claim 2 wherein said second insulating film at least partly overlaps one lightly doped impurity region between the channel region and one of the pair of impurity regions.
 18. A semiconductor device according to any one of claim 3, wherein said second insulating film at least partly overlaps one lightly doped impurity region between the channel region and one of the pair of impurity regions.
 19. A semiconductor device according to any one of claim 5, wherein said second insulating film at least partly overlaps one lightly doped impurity region between the channel region and one of the pair of impurity regions.
 20. A semiconductor device according to any one of claim 7, wherein said second insulating film at least partly overlaps one lightly doped impurity region between the channel region and one of the pair of impurity regions.
 21. A semiconductor device according to any one of claim 8, wherein said second insulating film at least partly overlaps one lightly doped impurity region between the channel region and one of the pair of impurity regions.
 22. A semiconductor device according to any one of claim 10, wherein said second insulating film at least partly overlaps one lightly doped impurity region between the channel region and one of the pair of impurity regions.
 23. A semiconductor device according to any one of claim 1, wherein said display comprises a driving circuit formed over said substrate.
 24. A semiconductor device according to any one of claim 2, wherein said display comprises a driving circuit formed over said substrate.
 25. A semiconductor device according to any one of claim 3, wherein said display comprises a driving circuit formed over said substrate.
 26. A semiconductor device according to any one of claim 4, wherein said display comprises a driving circuit formed over said substrate.
 27. A semiconductor device according to any one of claim 5, wherein said display comprises a driving circuit formed over said substrate.
 28. A semiconductor device according to any one of claim 6, wherein said display comprises a driving circuit formed over said substrate.
 29. A semiconductor device according to any one of claim 7, wherein said display comprises a driving circuit formed over said substrate.
 30. A semiconductor device according to any one of claim 8, wherein said display comprises a driving circuit formed over said substrate.
 31. A semiconductor device according to any one of claim 9, wherein said display comprises a driving circuit formed over said substrate.
 32. A semiconductor device according to any one of claim 10, wherein said display comprises a driving circuit formed over said substrate.
 33. A semiconductor device according to any one of claim 1, wherein said semiconductor device is one selected a group consisting of: video movie, digital camera, car navigation system, personal computer and projector.
 34. A semiconductor device according to any one of claim 2, wherein said semiconductor device is one selected a group consisting of: video movie, digital camera, car navigation system, personal computer and projector.
 35. A semiconductor device according to any one of claim 3, wherein said semiconductor device is one selected a group consisting of: video movie, digital camera, car navigation system, personal computer and projector.
 36. A semiconductor device according to any one of claim 4, wherein said semiconductor device is one selected a group consisting of: video movie, digital camera, car navigation system, personal computer and projector.
 37. A semiconductor device according to any one of claim 5, wherein said semiconductor device is one selected a group consisting of: video movie, digital camera, car navigation system, personal computer and projector.
 38. A semiconductor device according to any one of claim 6, wherein said semiconductor device is one selected a group consisting of: video movie, digital camera, car navigation system, personal computer and projector.
 39. A semiconductor device according to any one of claim 7, wherein said semiconductor device is one selected a group consisting of: video movie, digital camera, car navigation system, personal computer and projector.
 40. A semiconductor device according to any one of claim 8, wherein said semiconductor device is one selected a group consisting of: video movie, digital camera, car navigation system, personal computer and projector.
 41. A semiconductor device according to any one of claim 9, wherein said semiconductor device is one selected a group consisting of: video movie, digital camera, car navigation system, personal computer and projector.
 42. A semiconductor device according to any one of claim 10, wherein said semiconductor device is one selected a group consisting of: video movie, digital camera, car navigation system, personal computer and projector. 